This simple Platino-based Transistor Tester is designed to test transistors in a simple and portable way. Since it is tedious to read the markings on the transistor devices and to look up its characteristics in datasheets, a handy transistor tester makes its way in such scenarios. The Platino Transistor tester not only identifies the leads of the device but also the type and characteristics like Hfe of the device. The simplified design of Elektor’s Platino board makes it simpler to extend its capability to develop devices of complex functionality with a few enhancements.
- DC Input: 12V to 18V DC.
- Elektor Platino with ATMEGA32 microcontroller.
- 20 X 4 LCD Display.
- Elektor’s USB to Serial BOB module interfacing for debugging.
- Pluggable terminal block for easy mounting of transistor device to be tested.
- Identifies transistor type, leads and characteristics.
- Indicates faulty or no transistor.
- Results can be viewed on LCD as well as serial terminal simultaneously.
- Easy and portable design.
R1,R5,R9 = 100K, 5%, 250mW
R2,R6,R10 = 1k, 5%, 250mW
R3,R7,R11 = 100R, 5%, 250mW
R4,R8,R12 = 5.6k, 5%, 250mW
R13 = 4.7k, 5%, 250mW
C1 = 1000uF / 35V
C2,C3 = 100nF
C4 = 100uF / 16V
C5,C6,C7 = 1nF
IC1 = MC7805, 5 V, 1 A
IC2,IC3,IC4 = 74HC4052
D1 = 1N4007, 1000 V, 1 A
T1 = BC548
K1,K2,K2 = Pin socket, breakable, 1 row, 36-way, vertical
K4 = Pin socket, breakable, 2 rows, 72-way, vertical
K5 = Terminal block 5.08 mm, 2-way, 630 V
K6 = Terminal block 5.08 mm, 3-way, 630 V
IC2,IC3,IC4 = IC socket, DIP-16
R3 = 47R, 5%, 250mW
R4,R5,R6,R7,R10,R12 = 10K, 5%, 250mW
R11 = 4.7k, 5%, 250mW
P1 = 10 kΩ, trimmer, flat
C1,C2 = 22 pF, 50 V, C0G/NP0, 2.5 mm pitch
C5 = 100 nF, 50 V, X7R, 5.08 mm pitch
IC1 = Atmega 32-16PU
T1 = BC547C, 45 V, 100 mA, 500 mW, hfe=400
L1 = 10uH
IC socket, DIP-40
LCD1 = LCD, 4x20, 5 V, backlight
S5A = Encoder with pushbutton
K1,K2,K5 = Pin header, breakable, 1 row, 40-way, vertical
K4 = Pin header, breakable, 2 rows, 80-way, vertical
K9 = Pin socket, breakable, 1 row, 36-way, vertical
X1 = 8 MHz, 18 pF
This project is described in Elektor Magazine, edition March/April 2015, see:
|Category||Test & Measurement|